Bruker PAT SeriesProcess Analytical Technology

Bruker BEAMFT-NIR Process Analyzer

A compact, single-point FT-NIR process analyzer for real-time, non-destructive measurement of solids and semi-solids. Designed with flexible mounting at conveyors, hoppers, and process interfaces, fully supported through method development and production transfer by Antech Solutions across Ireland.

Compact Single-Point FT-NIR

Direct optical measurement at target process locations

Solids & Semi-Solids Analysis

Real-time non-destructive spectroscopic measurement

Flexible Interface Mounting

Adaptable to conveyors, hoppers, and process interfaces

Method & Transfer Support

Method development and production transfer assistance

IQ/OQ Qualification Support
OPC UA & SCADA Ready
Method Transfer Support
Feasibility, Chemometrics & Installation Support in Ireland
In-Line NIR Analyzer
Bruker Optics PAT
Bruker BEAM Process Analytical Technology near infrared spectrometer
Real-Time Non-Destructive Measurement
Performance depends on the instrument, application, sample matrix and validated method
Non-DestructiveMeasurement
IP65Washdown Rating
Application DomainsConveyors, Hoppers, Process Interfaces
Spectral RangeNear Infrared (NIR)